Our workshop ‘Challenges in Semiconductor Testing’ was held today in Catania, involving the most important players in our sector.
51 participants, 12 presentations and 12 moments of debate and discussion.
It was an experience of meeting, exchange and mutual enrichment that we will certainly repeat.

Thanks to all of you, protagonists of the day: 3Sun Gigafactory (Enel Green Power) – Advantest – AEIT – Analog Devices – CNR – EDA INDUSTRIES S.P.A. – Intel Corporation – ITING – ITALIANA INGEGNERIA S.R.L. – Meridionale Impianti S.p.A. – NXP Semiconductors – STMicroelectronics Italia – Synergie CAD Instruments – Teradyne – University of Catania DIEEI